2611B-L Digital source table

If you're scaling up your test floor or building a parallel test station, this instrument is for you. Why choose 30+ units of the 2611B-L? You get consistent performance across every SMU, plus TSP‑Link® technology that chains up to 64 units for high‑throughput parallel testing. Each unit offers 4‑quadrant operation (source & sink, 30W per channel), 0.015% basic accuracy for traceable unit‑to‑unit results, and 6½‑bit measurement resolution down to 100nV / 100fA sensitivity. Quick specs per unit: voltage up to 200V, current DC 1.5A (pulse 10A), resistance range from 500nΩ to 100TΩ. It also integrates a built‑in DMM, AWG, pulse generator, and electronic load. The Keithley 2611B‑L is perfect for semiconductor I‑V / C‑V testing (diodes, MOSFETs), solar cell & LED testing, materials research, and parallel production testing. With over 30 units ready for bulk purchase or system integration, feel free to DM for pricing and technical support.